Cause traced to component failure

Also indexed as

Nearby in Investigation conclusion of events related to devices

• XE1URCause traced to device design
• XE2TXCause traced to manufacturing
• XE18ECause traced to transport or storage
• XE7NNCause traced to infrastructure
• XE1WVCause traced to environment
• XE5ASCause traced to maintenance
• XE5UXCause traced to training
• XE674Cause traced to labeling